Omaña, Martín E.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Lazo de control optoacoplado para fuente conmutada

Binda, Eduardo A., Omaña, Martín E., Tacca, Hernán E.

Journal:

Revista Iberoamericana de Automática e Informática Industrial RIAI

Year:

2008

File:

PDF, 720 KB

2008

2

Low-Cost and High-Reduction Approaches for Power Droop During Launch-On-Shift Scan-Based Logic BIST

Omana, Martin, Rossi, Daniele, Beniamino, Edda, Metra, Cecilia, Tirumurti, Chandra, Galivanche, Rajesh

Journal:

IEEE Transactions on Computers

Year:

2015

Language:

english

File:

PDF, 2.48 MB

english, 2015

3

Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST

Omana, Martin, Rossi, Daniele, Fuzzi, Filippo, Metra, Cecilia, Tirumurti, Chandrasekharan, Galivanche, Rajesh

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2016

Language:

english

File:

PDF, 2.13 MB

english, 2016

4

Checkers’ No-Harm Alarms and Design Approaches to Tolerate Them

Daniele Rossi, Martin Omaña, Cecilia Metra

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 348 KB

english, 2008

5

Ultrastructural Study of the Encystation and Excystation Processes in Naegleria sp.

BIBIANA CHÁVEZ-MUNGUÍA, MARITZA OMAÑA-MOLINA, GUADALUPE CASTAÑÓN, PATRICIA BONILLA, MÓNICA GONZÁLEZ-LÁZARO, DOLORES HERNÁNDEZ-MARTÍNEZ, LIZBETH SALAZAR-VILLATORO, AMELIA ESPARZA-GARCÍA, ADOLFO MARTÍNE

Journal:

Journal of Eukaryotic Microbiology

Year:

2009

Language:

english

File:

PDF, 1.74 MB

english, 2009

6

Model for Transient Fault Susceptibility of Combinational Circuits

Martin Omaña, Daniele Rossi, Cecilia Metra

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 135 KB

english, 2004

7

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Impact of Aging Phenomena on Soft Error Susceptibility

Rossi, Daniele, Omaña, Martin, Metra, Cecilia, Paccagnella, Alessandro

Year:

2011

Language:

english

File:

PDF, 775 KB

english, 2011

8

Low Cost NBTI Degradation Detection and Masking Approaches

Omana, Martin, Rossi, Daniele, Bosio, Nicolo, Metra, Cecilia

Journal:

IEEE Transactions on Computers

Year:

2013

Language:

english

File:

PDF, 1.56 MB

english, 2013

9

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Specchia, Roberto, Metra, Cecilia, Marzencki, Marcin, Kaminska, Bozena

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2013

Language:

english

File:

PDF, 862 KB

english, 2013

10

Impact of Bias Temperature Instability on Soft Error Susceptibility

Rossi, Daniele, Omana, Martin, Metra, Cecilia, Paccagnella, Alessandro

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

11

Low-Cost On-Chip Clock Jitter Measurement Scheme

Omana, Martin, Rossi, Daniele, Giaffreda, Daniele, Metra, Cecilia, Mak, T. M., Rahman, Asifur, Tam, Simon

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 2.26 MB

english, 2015

12

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Model for Thermal Behavior of Shaded Photovoltaic Cells under Hot-Spot Condition

Giaffreda, Daniele, Omaña, Martin, Rossi, Daniele, Metra, Cecilia

Year:

2011

Language:

english

File:

PDF, 1.01 MB

english, 2011

13

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Transient Fault and Soft Error On-die Monitoring Scheme

Rossi, Daniele, Omana, Martin, Metra, Cecilia

Year:

2010

Language:

english

File:

PDF, 484 KB

english, 2010

14

Modeling and Detection of Hotspot in Shaded Photovoltaic Cells

Rossi, Daniele, Omana, Martin, Giaffreda, Daniele, Metra, Cecilia

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 1.70 MB

english, 2015

15

[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Novel On-Chip Clock Jitter Measurement Scheme for High Performance Microprocessors

Metra, Cecilia, Omaña, Martin, Mak, TM, Rahman, Asifur, Tam, Simon

Year:

2008

Language:

english

File:

PDF, 509 KB

english, 2008

16

Morphological Features and In Vitro Cytopathic Effect of Acanthamoeba griffini Trophozoites Isolated from a Clinical Case

González-Robles, Arturo, Salazar-Villatoro, Lizbeth, Omaña-Molina, Maritza, Reyes-Batlle, Maria, Martín-Navarro, Carmen M., Lorenzo-Morales, Jacob

Journal:

Journal of Parasitology Research

Year:

2014

Language:

english

File:

PDF, 1.87 MB

english, 2014

17

[ACM Press the 7th ACM international conference - Bertinoro, Italy (2010.05.17-2010.05.19)] Proceedings of the 7th ACM international conference on Computing frontiers - CF '10 - Low cost and low intrusive approach to test on-line the scheduler of high performance microprocessors

Rossi, Daniele, Omana, Martin E., Berghella, Gianluca, Metra, Cecilia, Jas, Abhijit, Tirumurti, Chandra, Galivanche, Rajesh

Year:

2010

Language:

english

File:

PDF, 438 KB

english, 2010

18

[ACM Press the 7th ACM international conference - Bertinoro, Italy (2010.05.17-2010.05.19)] Proceedings of the 7th ACM international conference on Computing frontiers - CF '10 - Novel low-cost aging sensor

Omaña, Martin, Rossi, Daniele, Bosio, Nicolò, Metra, Cecilia

Year:

2010

Language:

english

File:

PDF, 462 KB

english, 2010

19

Impact of Aging Phenomena on Latches’ Robustness

Omana, Martin, Rossi, Daniele, Edara, Tusharasandeep, Metra, Cecilia

Journal:

IEEE Transactions on Nanotechnology

Year:

2015

Language:

english

File:

PDF, 1.06 MB

english, 2015

20

[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - Intermittent and Transient Fault Diagnosis on Sparse Code Signatures

Kochte, Michael A., Dalirsani, Atefe, Bernabei, Andrea, Omana, Martin, Metra, Cecilia, Wunderlich, Hans-Joachim

Year:

2015

Language:

english

File:

PDF, 645 KB

english, 2015

21

Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness

Omana, Martin, Edara, Tusharasandeep, Metra, Cecilia

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2016

Language:

english

File:

PDF, 2.03 MB

english, 2016

22

New Approaches for Power Binning of High Performance Microprocessors

Omana, Martin, Padovani, Marco, Veliu, Kreshnik, Metra, Cecilia, Alt, Juergen, Galivanche, Rajesh

Journal:

IEEE Transactions on Computers

Year:

2017

Language:

english

File:

PDF, 3.56 MB

english, 2017

23

Fault-Tolerant Inverters for Reliable Photovoltaic Systems

Omana, Martin, Fiore, Alessandro, Mongitore, Marco, Metra, Cecilia

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2018

Language:

english

File:

PDF, 1.68 MB

english, 2018

24

Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers

Grossi, Marco, Omaña, Martin

Journal:

Journal of Electronic Testing

Year:

2019

Language:

english

File:

PDF, 872 KB

english, 2019

25

Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers

Grossi, Marco, Omaña, Martin

Journal:

Journal of Electronic Testing

Year:

2019

File:

PDF, 872 KB

2019

26

Effect of passaging on the stemness of infrapatellar fat pad‑derived stem cells and potential role of nucleostemin as a prognostic marker of impaired stemness

Radhakrishnan, Subathra, Trentz, Omana, Martin, Catherine, Reddy, Mettu, Rela, Mohamed, Chinnarasu, Marimuthu, Kalkura, Narayana, Sellathamby, Shanmugaapriya

Journal:

Molecular Medicine Reports

Year:

2019

File:

PDF, 2.15 MB

2019